CM-150 Screen Centering Microscope for Lab Centration Inspection
Fixed 15″ per division reticle graduation remains unchanged across different lenses, ensuring consistent measurement reference
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XIM800 is an inverted metallurgical microscope designed for electronic component inspection, semiconductor testing, and material surface analysis. It features a 45mm DIN achromatic objective with 10X and 100X (oil) options, a wide field plane eyepiece with 0.1mm cross micrometer, and a 45° inclined articulated binocular head. The system supports total magnification from 100X to 1250X with coaxial coarse and fine focusing, 25mm focusing range, and 0.002mm precision. Illumination uses a built-in 6V20W halogen lamp with Kohler system and color filters.
| Model | XIM800 |
|---|---|
| Eyepiece | WF10X/18mm (optional WF12.5X) |
| Eyepiece Micrometer | 0.1mm cross micrometer, 0.01mm scale |
| Objective | 45mm DIN Achromatic, 10X, 100X (oil immersion) |
| Viewing Head | Articulated free binocular, 45° inclined, interpupillary 55–75mm |
| Total Magnification | 100X–1250X |
| Stage | Double-layer mechanical, 200X180mm, two plates (Φ10, Φ20mm), X-Y movement 70X50mm |
| Focusing Mechanism | Coaxial coarse and fine, rack and pinion, tension adjustment, stage height limit knob |
| Focusing Range | 25mm |
| Focusing Precision | 0.002mm |
| Illumination | 6V20W halogen lamp, Kohler system, blue/green/yellow/ground glass filters |
| Net Weight | 8kg |
| Gross Weight | 10kg |
| Carton Dimension | 42X35X52cm |