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XIM300 Inverted Metallurgical Microscope for semiconductor

XIM300 Inverted Metallurgical Microscope for semiconductor

The XIM300 inverted metallurgical microscope from Nanjing AMADA Instrument is designed for semiconductor inspection, material surface analysis, and precision industrial testing. It features an infinite plan optical system with a 200 mm focal length, trinocular Siedentopf head, and long working distance objectives for deep sample access. Standard halogen illumination and optional filters support high-contrast imaging. The fixed stage with co-axial adjustment allows precise sample positioning.

  • Infinite plan optical system ensures flat, high-contrast images across the field of view
  • Long working distance objectives (up to 26.12 mm) allow inspection of thick or tall samples without contact
  • Trinocular head with 45° inclination and diopter adjustment supports ergonomic viewing and camera integration
  • Standard 6V 30W halogen lamp and optional 12V 50W lamp provide consistent illumination
  • Multiple filter options (blue, green, yellow) improve contrast for different sample types
  • Fixed stage with co-axial adjustment enables precise, repeatable sample positioning
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Technical features

  • Infinite plan optical system with F = 200 mm
  • Siedentopf trinocular head, 45° inclined, interpupillary distance 53–75 mm, diopter adjustable
  • WF10X / 22 mm eyepiece with high eye-point up to 21 mm
  • Quintuple nosepiece, inward facing
  • Long working distance Plan Achromatic objectives: 5X/0.10 (WD=26.12 mm), 10X/0.10 (WD=20.20 mm), 20X/0.25 (WD=8.80 mm), 40X/0.10 (WD=3.68 mm), 50X/0.40 (WD=3.68 mm), 60X/0.10 (WD=3.18 mm), 80X/0.10 (WD=1.28 mm), 100X/0.85 (dry, WD=0.40 mm)
  • BD series objectives: BD5X/0.12 (WD=9.70 mm), BD10X/0.25 (WD=9.30 mm), BD20X/0.40 (WD=7.23 mm), BD50X/0.70 (WD=2.50 mm), BD40X/0.60 (WD=3.00 mm), BD60X/0.70 (WD=1.90 mm), BD80X/0.80 (WD=0.80 mm), BD100X/0.85 (WD=0.22 mm)
  • Fixed stage: 242 × 200 mm, low-position co-axial flexible adjusting handle, moving range 30 × 30 mm
  • 6V 30W halogen lamp standard; 12V 50W halogen lamp optional

Who it is for

  • Semiconductor manufacturers and R&D labs
  • Electronics production lines requiring in-line inspection
  • Material science labs conducting surface and cross-section analysis
  • Importers sourcing inverted microscopes for industrial inspection systems

Specifications

ModelXIM300 / XIM300BD
Optical SystemInfinite Plan, F = 200 mm
Viewing TubeSiedentopf trinocular, 45° inclined, 53–75 mm interpupillary adjustment
EyepieceWF10X / 22 mm, high eye-point up to 21 mm
NosepieceQuintuple, inward facing
StageFixed, 242 × 200 mm, co-axial adjustment, 30 × 30 mm movement
Illumination6V 30W halogen (standard), 12V 50W halogen (optional)
FiltersBlue (Φ26), green (Φ26), yellow (Φ26)
C-Mount Adapters1X, 0.5X (for digital camera integration)
Packaging1 carton, G.W. 16 kg, Meas. 49 × 61 × 36 cm

Use guide

  • Select objectives based on required magnification and working distance for the sample
  • Use BD series objectives when inspecting samples with height or surface irregularities
  • Choose 12V 50W lamp if higher brightness is needed for low-contrast materials
  • Use filters to enhance contrast in specific sample types (e.g., green for silicon wafers)
  • Confirm digital camera model with the supplier before ordering C-Mount adapter

FAQ

What is the working distance for the 100X objective?
The 100X dry objective has a working distance of 0.40 mm.
Can I attach a digital camera?
Yes. The microscope includes C-Mount 1X and 0.5X adapters; provide your camera model in advance for compatibility.
What halogen lamp is standard?
The standard lamp is 6V 30W; 12V 50W is available as an optional upgrade.
What filters are included?
Blue, green, and yellow filters (Φ26 mm) are available as optional accessories.
Is the stage adjustable?
Yes. The fixed stage has a low-position co-axial flexible adjusting handle with a 30 × 30 mm moving range.

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