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F180 Bright Dark Semiapochromat/Apochromatic Metallurgical Objective

F180 Bright Dark Semiapochromat/Apochromatic Metallurgical Objective

F180 Bright Field Semiapochromat and Apochromat Metallurgical Objectives are precision optical lenses designed for high-resolution metallographic inspection in materials science, industrial quality control, and semiconductor manufacturing. The series includes 2.5X to 100X magnifications with numerical apertures from 0.08 to 0.9, offering improved resolution and depth of field for detailed surface analysis under bright and dark field illumination. Available in standard and long working distance (LWD) variants, they support both transmitted light and specialized contrast techniques.

  • High numerical aperture (NA) values from 0.08 to 0.9 for enhanced resolution and light gathering in metallographic applications
  • Long working distance (LWD) options (e.g., 14.5 mm, 8.7 mm, 8 mm) for inspecting thick or irregularly shaped samples
  • Dual illumination compatibility: bright field and dark field modes for improved contrast on reflective surfaces
  • Consistent resolution down to 0.34 μm and depth of field as low as 0.43 μm for fine defect detection
  • Standard and high-resolution variants available for critical inspection tasks
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Technical features

  • Magnification range: 2.5X to 100X with NA values from 0.08 to 0.9
  • Working distance (WD) from 1 mm (100X) to 14.8 mm (5X), with LWD variants up to 14.5 mm
  • Focal length from 1.8 mm (100X) to 72 mm (2.5X)
  • Resolution down to 0.34 μm (100X LWD apochromat), depth of field as low as 0.43 μm
  • Available in bright field semiapochromat, apochromat, and bright/dark field semiapochromat/apochromat variants
  • LWD (long working distance) models for non-contact inspection of bulky or irregular samples
  • High-resolution variants with optimized NA and focal length for maximum detail capture
  • Designed for use with transmitted light illumination systems in metallurgical microscopes

Who it is for

  • Materials testing and quality assurance teams in automotive, aerospace, and metal fabrication industries
  • Semiconductor and electronics manufacturers specifying high-resolution metallurgical objectives
  • Research labs conducting microstructure analysis of alloys and composites
  • Distributors sourcing calibrated objectives for industrial microscope systems
  • Procurement engineers requiring documented optical performance for compliance and calibration records

Specifications

ModelF180 Bright Field Semiapochromat / Apochromat
Magnification2.5X, 5X, 10X, 20X, 50X, 100X
Numerical Aperture0.08 to 0.9
Working Distance1 mm (100X) to 14.8 mm (5X)
Focal Length1.8 mm (100X) to 72 mm (2.5X)
Resolution0.34 μm (100X LWD apochromat)
Depth of Field0.43 μm (100X LWD apochromat)
Illumination TypeBright Field, Dark Field, or Dual Mode
Working Distance TypeStandard or Long Working Distance (LWD)

Use guide

  • Select magnification and NA based on required resolution and working distance
  • Use LWD variants when inspecting thick or irregular samples to avoid lens contact
  • Choose dark field mode for detecting surface defects, scratches, or inclusions on reflective metals
  • Match objective to microscope body and illumination system using published optical tables
  • Use high-resolution variants for failure analysis or precision metrology tasks

FAQ

What is the working distance for the 100X objective?
1 mm for standard 100X; 3.1 mm for 100X LWD variant.
Can this objective be used in dark field illumination?
Yes. Bright and dark field semiapochromat and apochromat variants are available.
What is the resolution at 50X magnification?
0.38 μm for standard 50X apochromat; 0.34 μm for high-resolution 50X apochromat.
Are these objectives compatible with standard metallurgical microscopes?
Yes. Designed for use with standard transmitted light metallurgical microscopes with 160 mm tube length.
What is the difference between standard and LWD objectives?
LWD (long working distance) objectives allow greater clearance between the lens and sample, suitable for thick or irregular samples.

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