Introduction TO MX12R Semiconductor FPD Inspection Microscope
Equipped with varisized wafer holders(including 4/6/8/12 inches), MX12R is professionally applied for wafer and flatpanel display detection, maximally supports for dia. 300mm of wafer and 17inches of FPD. More comfortable, flexible and quicker operation is availablewith upgraded ergonomics design.
a.Tilting viewing head
0~35 degreetilting viewing head for adjusting the height of eye point, provides the bestviewing angle to different users, relieving the fatigue from long-timeoperation and significantly improving the work efficiency.
b.Convenient and stable stage
Stage Clutch driven system, button up for quick movement and press down tocancel, is available to allay fatigue from long-time operation. Stage withlinear guide rail, is realizable to be lightly and smoothly moved.
c.Safe and highspeed electric nosepiece
With forward andbackward two buttons for switch, is quick to convert magnification and accurateto repeat orientation.Mechanical switch mode, effectively prolongs the servicelife of nosepiece.
d.Front operatingbuttons
MX12R adopts electriccontrol for nosepiece and aperture diaphragm, with control buttons in front, iseasy and convenient for operation, improve the working efficiency.
e.Shockproofframe
With six levelingfeet, MX12R metal frame is low-centered and highsteady, anti-knock to ensureimage stabilization.
f.realizesan automatic future
Supporting for brightfield, dark field, polarizing and DIC, MX12R is widely applied for inspectionsof semiconductor, FPD, circuit package, PCB, materials, casting metal ceramicpart, abrasive tools and so on.